TestWay™ - Custom Rules

Adapt the TestWay™ testability analyzer to your design and manufacturing processes using custom rules. While TestWay includes a large number of built-in rules, some users desire to add their own rules (design, DfT, testability). Perhaps some custom ASIC requires special design rules, or perhaps the manufacturing process imposes some constraints. Maybe there are some design guidelines intended to improve quality or reduce manufacturing costs. All major electronics manufacturers have distinctive practices. Some differences are historical, others are clearly aimed at gaining competitive advantage. TestWay custom rules permit users to confirm that their distinctive practices are being followed correclty.

Your own requirements in order to check:

  • Pin or device oriented rules.
  • Technological requirements (Design rules).
  • In-Circuit programming for flash EEPROM or FPGA.
  • Specific rules for ASIC.
  • Any customer’s rules!

You never have the same problem twice as TestWay capitalizes your knowledge through the customer’s rules.

Simple, natural language

Unlike other approaches which the C language or SQL database queries, TestWay uses simple natural language to describe new rules. Wild card characters (? and *) simplify the process even further by allowing many devices or pins to be covered by one rule.

Examples

    
    ! Design and EMC rules
    Pin (IN&DIGITAL) is not floating.
    Pin (NC) is connected to GROUND.

    ! DfT - PLD and FPGA testability
    Pin ISPEN* of device (ISPLSI) is connected to a pull-up.
    Pin PWRDWN? (IN) of device XC30?? is accessible.
    Pin M0 (IN) of device XC30?? is accessible.
    Pin M1 (IN) of device XC30?? is accessible.
    Pin M2 (IN) of device XC30?? is accessible.

    ! DfT - Check In-circuit programming of EEPROMs
    Pin A9 of device AM27C010 is protected by a device (DIODE).
    Pin CE_ of device AM27C010 is accessible.
    Pin OE_ of device AM27C010 is accessible.
    Pin PGM_ of device AM27C010 is accessible.
    Pin VPP of device AM27C010 is protected by a device (DIODE).
    Pin VCC of device AM27C010 is protected by a device (DIODE).
    Pin A9 of device AM29F040 is protected by a device (RESISTOR).

    ! DfT - Check specific requirements of ASICs
    Pin TNI of device PASS (ASIC) is connected to a pull-up.
    Pin TRST of device (ASIC) is connected to a pull-down.
    

A selection of our customers:

A selection of our customers
Nov 12-15

Productronica 2019

Nov 12 - Nov 15
Munich

Past Events

Apr 24-26

NEPCON China Shanghai 2019 – stand 1N13

Apr 24 - Apr 26
Shanghai
Chine
Mar 26

ElectroTest EXPO 2019

Mar 26
Newcastle-under-Lyme, Staffordshire
United Kingdom
Jan 26-31

IPC APEX Expo 2019

Jan 26 - Jan 31
San Diego
United States
Nov 28

SMTA Silicon Valley Expo

28 Nov 2018
San Jose, CA, USA
Nov 13-16

Electronica Munich 2018

13 Nov 2018 - 16 Nov 2018
Munich
Nov 7

PCB Carolina 2018

7 Nov 2018
NC 27606, USA