TestWay is designed to work with and provide benefit to a wide range of testers. TestWay is particularly valuable on boards that use a combination of boundary scan and in-circuit test techniques (bed of nails or flying probe).
TestWay for Boundary-Scan testers
- Start test development from schematic data.
- Generate all test data including netlist, models and configuration files for the following test systems: ASSET, ACCULOGIC, CORELIS, GOEPEL, INTELLITECH, JTAG Technologies, TEMENTO.
- View fault location connecting layout and schematic.
- Checks availability of BSDL files.
- Verifies BSDL files against IEEE 1149.1 standard.
- Identifies boundary scan chains and checks that each chain meets 1149.1 standard.
- Predicts fault coverage.
- Identifies clusters and manages test point insertion to partition clusters.
- Identifies the optimal location of parallel accesses (test points).
- Flying probe test program optimization.
TestWay for In-Circuit testers
- Start test development from schematic data.
- Generate all test data including netlist, models and configuration files for Agilent HP3070, GenRad 228x, Teradyne Z1800, Teradyne SPECTRUM.
- View fault location connecting layout and schematic.
- Conduct testability review.
- Estimate fault coverage and perform real coverage measurements.
- Provide bed-of-nails optimization (Test point minimization involving Boundary-Scan, analog components and clusters).
TestWay for Flying-Probes testers
- Coverage prediction and measurement.
- Test program optimizer (Up to 70% of test time saved) for TAKAYA APT8000 and APT9000.
