A selection of our customers:
25-APR-2017 to 27-APR-2017:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N14 (Shanghai, China)
14-FEB-2017 to 16-FEB-2017:
APEX EXPO - ASTER Technologies are exhibiting at the APEX EXPO in San Diego between February 14th - 16th, 2017. So why not visit booth 3844 during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)
08-NOV-2016 to 11-NOV-2016:
ASTER announces the first system level PCB viewer integrated with National Instruments TestStand.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools.
12-SEP-2016 to 15-SEP-2016:
Autotestcon - ASTER Technologies are exhibiting at Autotestcon on booth 1004 (Anaheim, USA)
26-APR-2016 to 28-APR-2016:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N17 (Shanghai, China)
15-MAR-2016 to 17-MAR-2016:
IPC APEX EXPO - Pleasevisit us at booth 1651 (Las vegas, USA)
March 2016 - Newsletter n.14: Visit ASTER at IPC APEX EXPO 2016 Show in Las Vegas
TestWay news 2015
November 2015 - Newsletter n.12: Visit ASTER at the AUTOTESTCON 2015 Show in Maryland, USA
10-NOV-2015 to 13-NOV-2015:
Productronica - Visit ASTER at Productronoca, Hall A1, Booth 232. Information & registration (Munich, Germany)
03-NOV-2015 to 05-NOV-2015:
IEEE AUTOTESTCON - Visit ASTER at the IEEE AutoTestCon, Booth 431. Information & registration. Press release (National Harbor, USE)
21-APR-2015 to 23-APR-2015:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth B-1J14 (Shanghai, China)
24-FEB-2015 to 26-FEB-2015:
IPC APEX EXPO - ASTER Technologies are exhibiting at APEX Expo between February 24th - 26th, 2015, Booth 415. So why not visit the booth during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)
11-NOV-2014 to 14-NOV-2014:
Electronica - ASTER Technologies are exhibiting at Electronica.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools. Read more …with our press release. (Munich, Germany)
23-APR-2014 to 25-APR-2014:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth A1-1E85 (Shanghai, China)
25-MAR-2014 to 27-MAR-2014:
IPC APEX EXPO - Booth 607 (Las vegas, USA)
DebugPlus™ - Schematic viewer
DebugPlus is a simple to use software module with effective and powerful
schematic display and search capabilities designed to reduce both time and cost
associated with test debug, associated documentation, and subsequent program
maintenance and repair. Using full Windows capabilities including the DDE data
exchange, DebugPlus may be used either standalone or combined with another
member of the QUAD family:
RepairPlus for layout and
FaultView for fault tickets.
- Fast schematic display.
- Search of components, nets, pins or nails with automatic zoom on the
- Insertion and positioning of test channel numbers or node names.
- Print capability for schematic sheets including nail information.
- Digitalizing function for component and pin location where no CAD
reference data is available.
- Possibility to have interaction between schematic, Fault tickets and
- DDE interface for communication with external applications.
- Multilingual user interface (English, French, German)
- Designed for Microsoft Windows (Windows 9x, Me, NT4, NT2000, XP)
DebugPlus generates cost savings within several areas of the engineering, test
and repair process which together provide significant overall savings:
- Reduces the time taken to create documentation including the "marked-up"
- Reduces debug time through faster component, net, pin, and testpoint
location and analysis.
- Reduces time spent during the administration and update of schematic
- Provides fast and easy access to the schematic during repair and by
In addition, DebugPlus provides the platform for the generation of error free
and consistent documentation related to ISO9000.