ASTER Services

Testability analysis

Using TestWay, ASTER provides advanced Testability report:

  • Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test.
  • Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
  • Test balancing.
  • Test coverage prediction and measurement.
  • Production yield prediction – Defect opportunities.
  • Boundary-Scan test program generation.
  • Flying Probe Test program optimization.
    The powerful combination of flying probe test and JTAG test speeds up testing (PDF file, 190k)Adobe Acrobat PDF


  • BSDL models library (More than 500 validated BSDL files).
  • BSDL file validation at design level using VERILOG or VHDL simulation.
  • BSDL file validation at production level using physical verification.
  • Testalibility analysis.
  • Boundary-Scan test development (infrastructure test, interconnect test, cluster test, Flash EEPROM download, FPGA programming, system level test…).
  • Test coverage prediction and measurement.
  • Boundary-Scan tests transfer from PC based Boundary-Scan system to In-circuit tester (Genrad GR228x, Agilent HP3070, Teradyne Z1800, Teradyne Spectrum, Ifr 4200, Rohde & Schwarz).


  • Testability training.
  • Boundary-Scan test training and workshop.


A selection of our customers:

A selection of our customers
Jun 9-12


Jun 9 - Jun 12
Apr 29

ElectroTest Expo 2020

Apr 29
Cowley, Oxford
United Kingdom
Mar 26

SMTA Houston Expo & Tech Forum 2020

Mar 26
Stafford, TX, USA
Mar 24

SMTA Dallas Expo & Tech Forum

Mar 24
Plano, TX, USA
Feb 4-7

IPC APEX Expo 2020

Feb 4 - Feb 5
San Diego
United States
Nov 12

Productronica 2019

12 Nov 2019
Apr 24-26

NEPCON China Shanghai 2019 – stand 1N13

24 Apr 2019 - 26 Apr 2019