ASTER Services

Testability analysis

Using TestWay, ASTER provides advanced Testability report:

  • Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test.
  • Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
  • Test balancing.
  • Test coverage prediction and measurement.
  • Production yield prediction – Defect opportunities.
  • Boundary-Scan test program generation.
  • Flying Probe Test program optimization.
    The powerful combination of flying probe test and JTAG test speeds up testing (PDF file, 190k)Adobe Acrobat PDF


  • BSDL models library (More than 500 validated BSDL files).
  • BSDL file validation at design level using VERILOG or VHDL simulation.
  • BSDL file validation at production level using physical verification.
  • Testalibility analysis.
  • Boundary-Scan test development (infrastructure test, interconnect test, cluster test, Flash EEPROM download, FPGA programming, system level test…).
  • Test coverage prediction and measurement.
  • Boundary-Scan tests transfer from PC based Boundary-Scan system to In-circuit tester (Genrad GR228x, Agilent HP3070, Teradyne Z1800, Teradyne Spectrum, Ifr 4200, Rohde & Schwarz).


  • Testability training.
  • Boundary-Scan test training and workshop.


A selection of our customers:

A selection of our customers
Nov 13-16

Electronica Munich 2018

Nov 13 @ 8 h 00 min - Nov 16 @ 17 h 00 min CET

Past Events

May 2-3

DMEMS San Diego 2018

May 2 - May 3
Del Mar
Apr 24-26

NEPCON China Shanghai 2018 – stand 1E57

Apr 24 - Apr 26
Mar 14

ElectroTest EXPO 2018

Mar 14
Towcester, Northants
Feb 27-1

IPC APEX Expo 2018

Feb 27 - Mar 1
San Diego
United States
Jan 25

SMTA Rocky Mountain Expo 2018

Jan 25
Jan 18

SMTA Space Coast Expo 2018

Jan 18