ASTER Services

Testability analysis


Using TestWay, ASTER provides advanced Testability report:

  • Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test.
  • Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
  • Test balancing.
  • Test coverage prediction and measurement.
  • Production yield prediction – Defect opportunities.
  • Boundary-Scan test program generation.
  • Flying Probe Test program optimization.
    The powerful combination of flying probe test and JTAG test speeds up testing (PDF file, 190k)Adobe Acrobat PDF

Boundary-Scan


  • BSDL models library (More than 500 validated BSDL files).
  • BSDL file validation at design level using VERILOG or VHDL simulation.
  • BSDL file validation at production level using physical verification.
  • Testalibility analysis.
  • Boundary-Scan test development (infrastructure test, interconnect test, cluster test, Flash EEPROM download, FPGA programming, system level test…).
  • Test coverage prediction and measurement.
  • Boundary-Scan tests transfer from PC based Boundary-Scan system to In-circuit tester (Genrad GR228x, Agilent HP3070, Teradyne Z1800, Teradyne Spectrum, Ifr 4200, Rohde & Schwarz).

Training


  • Testability training.
  • Boundary-Scan test training and workshop.

satisfaction

A selection of our customers:

A selection of our customers
Feb 3-6

IPC APEX Expo 2020

3 Feb 2020 - 6 Feb 2020
San Diego
United States

Past Events

Nov 11-15

Productronica 2019

Nov 11 - Nov 15
Munich
Apr 23-26

NEPCON China Shanghai 2019 – stand 1N13

Apr 23 - Apr 26
Shanghai
Chine
Mar 25-26

ElectroTest EXPO 2019

Mar 25 - Mar 26
Newcastle-under-Lyme, Staffordshire
United Kingdom
Nov 27-28

SMTA Silicon Valley Expo

27 Nov 2018 - 28 Nov 2018
San Jose, CA, USA
Nov 12-16

Electronica Munich 2018

12 Nov 2018 - 16 Nov 2018
Munich
Nov 6-7

PCB Carolina 2018

6 Nov 2018 - 7 Nov 2018
NC 27606, USA