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The ASTER Technologies Newsletter

September 2016   Volume 15

Inside this issue... 1. Visit ASTER at IEEE AUTOTESTCON 2016 Show in Anaheim, CA. 2. TestWay Express: Lean NPI optimizes Test Coverage. 3. twSystem: the first system level viewer. 4. QuadView integrated within TestStand and LabView.	Visit ASTER at IEEE AUTOTESTCON 2016 Show in Anaheim, CA
	ASTER Technologies will be exhibiting at IEEE AUTOTESTCON 2016 show in Anaheim, CA, between 12th to the 15th of September, 2016. Why not come and visit us in Booth 1004? Please join us and discuss any requirements you may have relating to Board & System visualization, Electrical DfT analysis, Test Coverage analysis, Test program generation, CAD translation or Quality Management. Visit Official IEEE AUTOTESTCON 2016 web site
	TestWay Express analyzes test coverage for lean manufacturing
Lean NPI optimizes Test Coverage.	TestWay Express is a fully integrated solution that enables electronic manufacturers to optimize the design to test flow: Define the manufacturing line; including a combination of assembly, inspection and test machines. Estimate the test coverage of each individual stage and optimize the combined results. Generate the input files for each test stage that reflect the selected strategy. Measure the real test coverage by importing the post-debug test program or coverage data. Compare the early estimation with the actual measured test program coverage, identifying gaps in the overall strategy. Test is essential for improving product quality by striving to detect and prevent faults on a product. This maximizes the number of good products shipped to the customer. TestWay helps to: Define the optimum test strategy to maximize the test coverage. Produce a test specification document that defines what to test. Compare the developed tests against the test requirements. Understand the production process capability and determine an acceptable level of defects that can be shipped to the customer. TestWay Express is built around TestWay, the industry leading DfT and test coverage analysis tool from the ASTER product portfolio. CAD converter, Comparative Data Checker, Bed of nails re-use, automatic documentation for Assembly or Test will be demonstrated. Download the ATS-Design For Excellence presentation… Download the TestWay Express brochure…
	System viewer: twSystem
Christophe LOTZ, President of ASTER, announces a new product: twSystem, the first board level system viewer in the World!	twSystem can be used in the design environment to assist DfT and test coverage analysis at the schematic capture stage as well as during prototype troubleshooting. Within the manufacturing environment, it becomes an integral part of the repair cycle, assisting in the locating of faults and significantly reducing repair time. twSystem is designed to import native CAD data for each board comprising the system. In addition, a formal description of the backplane or cables is used to describe the interconnection of the boards. Product performance is a critical issue in order to speed-up loading, viewing, searching and navigation, even when the system includes more than 10 boards with 3000 components on each. When the CAD data of the system is loaded, twSystem delivers various representations of the system. List of the boards, backplanes and cables comprising the system. When a board is part of an interconnection, the corresponding connection is highlighted. Flat netlist view of the full system, which is the foundation for navigation between interconnecting boards within a system. Mechanical 3D interactive view of the box, including the boards. One window for each active board. Each combining the BOM, schematic diagram and CAD layout. Please contact me for a proof of concept…
	QuadView deeply integrated with TestStand and LabView
	Functional test solutions are developed, primarily within the hardware design environment, as a test vehicle for verifying that a PCB meets its design criteria. Once the design validation and prototyping test phases are complete, the test vehicle is transferred to the Test Engineering department. It is then used as a functional test platform to verify that manufactured products meet their performance specification and are 'fit for purpose' to be shipped to the customer. The functional test stage is the final PCB quality gate. However, functional testers are a challenge because: Functional test program development is time consuming compared with structural test. It is extremely difficult to predict test coverage provided by a test program unless fault simulation has been undertaken. Fault diagnosis is either limited or in some cases non-existent, with the majority of tests simply providing a PASS/FAIL status. ASTER is pleased to announce a revolutionary technology to eliminate functional test drawbacks: the integration of QuadView within National Instruments TestStand and LabView. Reduced test program development & debug using the schematic & virtual schematic views. Precise test coverage analysis during functional test development. Quick localization of failure/defect on schematic and layout view: QuadView is used as Repair station. Accurate diagnosis using the Sherlock algorithm: Overlapping test analysis between functional test steps or between structural tests and functional tests. Please contact me for a demonstration…

For more information on any of the topics contained in this issue of the ASTER Technologies newsletter, please contact ASTER using the contact details listed below.

Corporate Headquarters ASTER Technologies 55 bis rue de Rennes 35510 CESSON SEVIGNE FRANCE Phone: +33 (0)2 99 83 01 01 Fax: +33 (0)2 99 83 01 00 E-mail: sales@aster-technologies.com

USA ASTER Technologies LLC P.O. Box 7163 Colorado Springs CO 80933-7163 United States of America Phone: +1 719-264-7698 Mob: +1 719-331-0346 E-mail: sales-USA@aster-technologies.com

United Kingdom ASTER Technologies Ltd. PO Box 327 Tarporley, Cheshire, CW6 9WD United Kingdom Phone: +44 (0)1829 261557 Mob: +44 (0)7711 927840 E-mail: sales-UK@aster-technologies.com

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