Inside this issue…

1. Visit ASTER at the IPC APEX 2018 Show in San Diego.
2. TestWay Express: Lean NPI optimizes Test Coverage.
3. Free 3D viewer visualize nails and pushers.
4. twSystem: the first system coverage analyzer.
5. QuadView integrated within TestStand and LabView.

Visit ASTER at the IPC APEX 2018 Show in San Diego, California – USA

APEX
ASTER Technologies will be exhibiting at Apex 2018 in San Diego, CA, during February 27-March 1.
Why not come and visit us at Booth number 2215?
Please join us and discuss any requirements you may have relating to Board & System visualization,
Electrical DfT analysis, Test Coverage analysis, Test program generation, CAD translation or Quality Management.ASTER will also be demonstrating their advanced technology that enables lean NPI. See below for more details.

  • TestWay Express: Multiple instance of inspection and test machines in the test line.
  • TestWay & twExpress: Test line overview presenting at each step, the inspection and test machine, relative test coverage, cumulative coverage and escape rate.
  • twSystem: Coverage analysis at system level.
  • Integration with TestStand: new Sherlock algorithm which analyzes the overall test line in order to deliver accurate diagnostics.

 

TestWay Express generates optimized test programs for manufacturing line

Lean NPI optimizes Test Coverage.
DfT de la conception au productionTestWay Express is a fully integrated solution that enables electronic manufacturers to optimize the design to test flow:

  • Define the manufacturing line; including a combination of assembly, inspection and test machines.
  • Estimate the test coverage of each individual stage and optimize the combined results.
  • Generate the input files for each test stage that reflect the selected strategy.
  • Measure the real test coverage by importing the post-debug test program or coverage data.
  • Compare the early estimation with the actual measured test program coverage, identifying gaps in the overall strategy.

Test is essential for improving product quality by striving to detect and prevent faults on a product. This maximizes the number of good products shipped to the customer. TestWay helps to:

  • Define the optimum test strategy to maximize the test coverage.
  • Produce a test specification document that defines what to test.
  • Compare the developed tests against the test requirements.
  • Understand the production process capability and determine an acceptable level of defects that can be shipped to the customer.

TestWay Express is built around TestWay, the industry leading DfT and test coverage analysis tool from the ASTER product portfolio.

CAD converter, Comparative Data Checker, Bed of nails re-use, automatic documentation for Assembly or Test will be demonstrated.

Download the TestWay Express brochure…

Free 3D viewer

ASTER users get free access to 3D converter and viewer
Free 3D viewer for TestWay and twExpressIt is now possible to produce a 3D view of the Board under analysis:

  • Convert 2D layout CAD data into 3D VRML and X3D model.
  • Visualize the 3D model through our fully integrated 3D viewer.
  • Rotate view through 360 degrees for detailed analysis.
  • View the position of the nails probes and pushers/fingers.
  • Print the 3D model with 3D printers to analyze mechanical constraints.

 

Please contact me for a demonstration…

System coverage analyzer: twSystem

Christophe LOTZ, President of ASTER, announces a new product: twSystem, the first board level system viewer in the World!

twSystem, was awarded the ENOVA 2017 – Paris, “Innovation Nugget”.

Doc PortaltwSystem can be used in the design environment to assist DfT and test coverage analysis at the schematic capture stage
as well as during prototype troubleshooting. Within the manufacturing environment, it becomes an integral part of the
repair cycle, assisting in the locating of faults and significantly reducing repair time.twSystem is designed to import native CAD data for each board comprising the system.
In addition, a formal description of the backplane or cables is used to describe the interconnection of the boards.Product performance is a critical issue in order to speed-up loading, viewing, searching and navigation, even when the system
includes more than 10 boards with 3000 components on each.When the CAD data of the system is loaded, twSystem delivers various representations of the system.

  • List of the boards, backplanes and cables comprising the system. When a board is part of an interconnection,
    the corresponding connection is highlighted.
  • Flat netlist view of the full system, which is the foundation for navigation between interconnecting boards within a system
  • Mechanical 3D interactive view of the box, including the boards.
  • One window for each active board. Each combining the BOM, schematic diagram and CAD layout.

ASTER announces system level coverage analysis – The first in the world!

  • Combine each individual electrical board test and inspection, along with the system level test, to calculate a total system coverage.
  • Generate test strategy overview and Production Model for each board and the complete system.

 

Please contact me for a proof of concept…

QuadView deeply integrated with TestStand and LabView

TestStand
LabView
QuadView integrated with TestStandA functional test solution is developed, primarily within the hardware design environment, as a test vehicle for verifying that a PCB meets its design criteria.
Once the design validation and prototyping test phases are complete, the test vehicle is transferred to the Test Engineering department.
It is then used as a functional test platform to verify that manufactured products meet their performance specification and are ‘fit for purpose’ to be shipped to the customer.
The functional test stage is the final PCB quality gate.However, functional testers are a challenge because:

  • Functional test program development is time consuming compared with structural test.
  • It is extremely difficult to predict test coverage provided by a test program unless fault simulation has been undertaken.
  • Fault diagnosis is either limited or in some cases non-existent, with the majority of tests simply providing a PASS/FAIL status.

ASTER is pleased to announce a revolutionary technology to eliminate functional test drawbacks: the integration of QuadView within National Instruments TestStand and LabView.

  • Reduced test program development & debug using the schematic & virtual schematic views.
  • Precise test coverage analysis during functional test development.
  • Quick localization of failure/defect on schematic and layout view: QuadView is used as Repair station.
  • Accurate diagnosis using the Sherlock algorithm: Overlapping test analysis between
    functional test steps or between structural tests and functional tests.

 

Please contact me for a demonstration…

For more information on any of the topics contained in this issue of the ASTER Technologies newsletter,
please contact ASTER.

 

A selection of our customers:

A selection of our customers
Nov 11-15

Productronica 2019

Nov 11 - Nov 15
Munich
Apr 23-26

NEPCON China Shanghai 2019 – stand 1N13

Apr 23 - Apr 26
Shanghai
Chine
Mar 25-26

ElectroTest EXPO 2019

Mar 25 - Mar 26
Newcastle-under-Lyme, Staffordshire
United Kingdom
Jan 25-31

IPC APEX Expo 2019

Jan 25 - Jan 31
San Diego
United States
Nov 27-28

SMTA Silicon Valley Expo

27 Nov 2018 - 28 Nov 2018
San Jose, CA, USA
Nov 12-16

Electronica Munich 2018

12 Nov 2018 - 16 Nov 2018
Munich
Nov 6-7

PCB Carolina 2018

6 Nov 2018 - 7 Nov 2018
NC 27606, USA