The February 2018 ASTER Technologies Newsletter

• TestWay Express: Multiple instance of inspection and test machines in the test line.
• TestWay & twExpress: Test line overview presenting at each step, the inspection and test machine, relative test coverage, cumulative coverage and escape rate.
• twSystem: Coverage analysis at system level.
• Integration with TestStand: new Sherlock algorithm which analyzes the overall test line in order to deliver accurate diagnostics.

• Define the manufacturing line; including a combination of assembly, inspection and test machines.
• Estimate the test coverage of each individual stage and optimize the combined results.
• Generate the input files for each test stage that reflect the selected strategy.
• Measure the real test coverage by importing the post-debug test program or coverage data.
• Compare the early estimation with the actual measured test program coverage, identifying gaps in the overall strategy.

Test is essential for improving product quality by striving to detect and prevent faults on a product. This maximizes the number of good products shipped to the customer. TestWay helps to:

• Define the optimum test strategy to maximize the test coverage.
• Produce a test specification document that defines what to test.
• Compare the developed tests against the test requirements.
• Understand the production process capability and determine an acceptable level of defects that can be shipped to the customer.

TestWay Express is built around TestWay, the industry leading DfT and test coverage analysis tool from the ASTER product portfolio.

CAD converter, Comparative Data Checker, Bed of nails re-use, automatic documentation for Assembly or Test will be demonstrated.

Download the TestWay Express brochure…

• Convert 2D layout CAD data into 3D VRML and X3D model.
• Visualize the 3D model through our fully integrated 3D viewer.
• Rotate view through 360 degrees for detailed analysis.
• View the position of the nails probes and pushers/fingers.
• Print the 3D model with 3D printers to analyze mechanical constraints.

Please contact me for a demonstration…

• List of the boards, backplanes and cables comprising the system. When a board is part of an interconnection,
  the corresponding connection is highlighted.
• Flat netlist view of the full system, which is the foundation for navigation between interconnecting boards within a system
• Mechanical 3D interactive view of the box, including the boards.
• One window for each active board. Each combining the BOM, schematic diagram and CAD layout.

ASTER announces system level coverage analysis – The first in the world!

• Combine each individual electrical board test and inspection, along with the system level test, to calculate a total system coverage.
• Generate test strategy overview and Production Model for each board and the complete system.

Please contact me for a proof of concept…

• Functional test program development is time consuming compared with structural test.
• It is extremely difficult to predict test coverage provided by a test program unless fault simulation has been undertaken.
• Fault diagnosis is either limited or in some cases non-existent, with the majority of tests simply providing a PASS/FAIL status.

ASTER is pleased to announce a revolutionary technology to eliminate functional test drawbacks: the integration of QuadView within National Instruments TestStand and LabView.

• Reduced test program development & debug using the schematic & virtual schematic views.
• Precise test coverage analysis during functional test development.
• Quick localization of failure/defect on schematic and layout view: QuadView is used as Repair station.
• Accurate diagnosis using the Sherlock algorithm: Overlapping test analysis between
  functional test steps or between structural tests and functional tests.

Please contact me for a demonstration…