ASTER Technologies News

What is inspection coverage in comparison to test coverage?

What is inspection coverage in comparison to test coverage?

Test coverage is a key set of metrics to ensure that delivered electronics products are defect free. Inspection was historically considered as part of process control but with increasing performance it becomes part of the defect detection process. From the test...

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QuadView deeply integrated with TestStand and LabView

QuadView deeply integrated with TestStand and LabView

A functional test solution is developed, primarily within the hardware design environment, as a test vehicle for verifying that a PCB meets its design criteria. Once the design validation and prototyping test phases are complete, the test vehicle is transferred to the...

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twSystem, the first board level system viewer in the World!

twSystem, the first board level system viewer in the World!

Christophe LOTZ, President of ASTER, announces a new product: twSystem, the first board level system viewer in the World! twSystem, was awarded the ENOVA - Paris, "Innovation Nugget". twSystem can be used in the design environment to assist DfT and test coverage...

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The February 2018 ASTER Technologies Newsletter

The February 2018 ASTER Technologies Newsletter

Inside this issue... 1. Visit ASTER at the IPC APEX 2018 Show in San Diego. 2. TestWay Express: Lean NPI optimizes Test Coverage. 3. Free 3D viewer visualize nails and pushers. 4. twSystem: the first system coverage analyzer. 5. QuadView integrated within TestStand...

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The first board level system viewer: twSystem

The first board level system viewer: twSystem

AUTOTESCON Maryland USA / Cesson-Sévigné FRANCE November 2 2015 ASTER Technologies, the leading supplier in Board-Level Testability, Test Coverage analysis and Design for Excellence (DfX) products, announces a new product named twSystem: the first board...

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twDocumentor : Documentation for DfT, test and assembly

twDocumentor : Documentation for DfT, test and assembly

Cesson-Sévigné, FRANCE /NEPCON-China 2013, Shanghai, 15th April 2013. ASTER has developed innovative modules for documentation and engineering: • twDocumentor® is a powerful document management tool that allows quick and easy creation of comprehensive shop...

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TestWay The reference in Design for Excellence (DfX)

TestWay The reference in Design for Excellence (DfX)

Cesson-Sévigné, FRANCE /APEX 2013, San Diego, USA, 19th January 2013. ASTER Technologies, the leading supplier in Board-Level Testability and Test Coverage analysis products, has developed a major new release of TestWay, the reference in Design for Excellence (DfX),...

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TestWay Express generates lean test & assembly programs

TestWay Express generates lean test & assembly programs

Cesson-Sévigné, FRANCE /Electronica 2012, Munich, Germany, November, 13 2012. TestWay Express is a fully integrated solution that enables electronic manufacturers to optimize the design to delivery flow by: Defining the manufacturing line; including a...

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A selection of our customers:

A selection of our customers
Mar 26

ElectroTest EXPO 2019

Mar 26
Newcastle-under-Lyme, Staffordshire
United Kingdom
Jan 26-31

IPC APEX Expo 2019

Jan 26 - Jan 31
San Diego
United States
Nov 28

SMTA Silicon Valley Expo

28 Nov 2018
San Jose, CA, USA
Nov 13-16

Electronica Munich 2018

13 Nov 2018 - 16 Nov 2018
Munich
Nov 7

PCB Carolina 2018

7 Nov 2018
NC 27606, USA
Oct 23-24

Enova Paris 2018

23 Oct 2018 - 24 Oct 2018
Paris
France
Oct 16-17

SMTA International 2018

16 Oct 2018 - 17 Oct 2018
Rosemont, IL, USA