ASTER Technologies News
ASTER and IPC-CFX connect at Productronica
Save the date for our upcoming exhibition ASTER and IPC-CFX connect at Productronica ASTER Technologies has teamed up with leading providers of the electronic manufacturing and testing industry to demonstrate traceability, diagnostic, repair and analytics...
What is inspection coverage in comparison to test coverage?
Test coverage is a key set of metrics to ensure that delivered electronics products are defect free. Inspection was historically considered as part of process control but with increasing performance it becomes part of the defect detection process. From the test...
QuadView deeply integrated with TestStand and LabView
A functional test solution is developed, primarily within the hardware design environment, as a test vehicle for verifying that a PCB meets its design criteria. Once the design validation and prototyping test phases are complete, the test vehicle is transferred to the...
twSystem, the first board level system viewer in the World!
Christophe LOTZ, President of ASTER, announces a new product: twSystem, the first board level system viewer in the World! twSystem, was awarded the ENOVA - Paris, "Innovation Nugget". twSystem can be used in the design environment to assist DfT and test coverage...
The February 2018 ASTER Technologies Newsletter
Inside this issue... 1. Visit ASTER at the IPC APEX 2018 Show in San Diego. 2. TestWay Express: Lean NPI optimizes Test Coverage. 3. Free 3D viewer visualize nails and pushers. 4. twSystem: the first system coverage analyzer. 5. QuadView integrated within TestStand...
‘Innovation nugget’ awarded to company in Cesson-Sévigné, France
The international innovation show ENOVA, was held in PARIS from 19 to 21 September 2017. Among more than 150 new products, the latest software from ASTER Technologies, has been identified by the experts’ committee and rewarded in the category “Innovation nugget”. The...
The first board level system viewer: twSystem
AUTOTESCON Maryland USA / Cesson-Sévigné FRANCE November 2 2015 ASTER Technologies, the leading supplier in Board-Level Testability, Test Coverage analysis and Design for Excellence (DfX) products, announces a new product named twSystem: the first board...
twDocumentor : Documentation for DfT, test and assembly
Cesson-Sévigné, FRANCE /NEPCON-China 2013, Shanghai, 15th April 2013. ASTER has developed innovative modules for documentation and engineering: • twDocumentor® is a powerful document management tool that allows quick and easy creation of comprehensive shop...
TestWay The reference in Design for Excellence (DfX)
Cesson-Sévigné, FRANCE /APEX 2013, San Diego, USA, 19th January 2013. ASTER Technologies, the leading supplier in Board-Level Testability and Test Coverage analysis products, has developed a major new release of TestWay, the reference in Design for Excellence (DfX),...
TestWay Express generates lean test & assembly programs
Cesson-Sévigné, FRANCE /Electronica 2012, Munich, Germany, November, 13 2012. TestWay Express is a fully integrated solution that enables electronic manufacturers to optimize the design to delivery flow by: Defining the manufacturing line; including a...
