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WildScan: Boundary-Scan test migration with ICT

WildScan Overview

WildScan enables migration of Boundary-Scan test (BST) program to In-Circuit testers (ICT) without the need for complementary hardware integration within the target In-Circuit testers. This significantly reduces test fixturing costs by utilizing the same test fixture for both Boundary-Scan and In-circuit testing, providing a one-stop test solution.
WildScan
WildScan analyzes the following test sequences:
  • Infrastructure test.
  • Interconnections test.
  • Cluster tests.
  • In-system configuration of EPLD and the FPGA devices (excluding components that require specific programming algorithms or data pulling, ie: FLASH EPROM).

A complete set of test sequences that include Boundary-Scan test bus (TDI, TDO, TCK, TMS) test vectors and parallel I/O channels test vectors are created.
The quality of GO/NOGO testing is maintained during conversion and the BST diagnostics are transferred as an integrated part of the In-Circuit Test program, or using the WildScan diagnosis capability.

Combined Boundary-Scan & ICT test strategies

Within a PCB production line that utilises In-Circuit test (ICT) and Boundary-Scan test (BST) as the main production test strategy, a number of combined test strategy options are possible, such as:
  • Complete production test using two test stages on two independent testers. With this solution the boards must at first be declared PASS on the ICT tester, prior to being convoyed to the BST tester. This solution requires two test fixtures (at additional expense), increases the production test time and is more difficult to handle for high volume production.

  • One Step Test using two test systems integrated within the same platform. With this solution the BST tester is integrated within the ICT tester. This hardware and most probably software integration, requires a minimum of co-operation between the suppliers of BST and ICT testers.

  • One step test on ICT test system. Taking into account the cost of a BST tester and assuming that ICT testers resources are at least equivalent regarding the performances requested, WildScan is innovative solution for providing a one step test without the need for additional proprietary hardware.

Key product benefits

Simple software translation

Migration is provided by a simple software translation without the need for any additional proprietary hardware to be integrated within the In-circuit tester. WildScan converts Boundary-Scan parallel accesses into standard In-Circuit Channels.

Specific migration packages provided on request

The product portfolio currently consists of a Goepel translator, but additional translators for other Boundary-Scan platforms, such as ASSET and JTAG Technologies can be developed on request.

Specific file generation

Specific tester files have been developed for the following In-circuit testers; Agilent, GenRad, IFR, Rhode & Schwarz, Schlumberger and Teradyne.

Industry Standard file generation

Industry Standard file formats are supported such as; EDIF 2.0 netlist, BSDL model, JEDEC Wave and Serial Vector Format (SVF).

Multi-platform support

The WildScan migration software will operate on multiple platforms such as; PC, Sun/Sparc and Solaris

Tell me more

Other products

  • TPQR, Test Program Quality Report
  • TestWay, Board testability analyzer
  • QuadView, Next generation viewers
  • Quad, Quality advisor and manager
  • QuadFeederSafe, make your feeder settings secure


 
     
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