A selection of our customers:

ASTER's satisfied customers


Latest news:

25-APR-2017 to 27-APR-2017:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N14 (Shanghai, China)
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NEPCON-China-2017-Show-Logo

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14-FEB-2017 to 16-FEB-2017:
APEX EXPO - ASTER Technologies are exhibiting at the APEX EXPO in San Diego between February 14th - 16th, 2017. So why not visit booth 3844 during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)
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08-NOV-2016 to 11-NOV-2016:
ASTER announces the first system level PCB viewer integrated with National Instruments TestStand.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools.
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12-SEP-2016 to 15-SEP-2016:
Autotestcon - ASTER Technologies are exhibiting at Autotestcon on booth 1004 (Anaheim, USA)
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26-APR-2016 to 28-APR-2016:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N17 (Shanghai, China)
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15-MAR-2016 to 17-MAR-2016:
IPC APEX EXPO - Pleasevisit us at booth 1651 (Las vegas, USA)
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07-MAR-2016:
March 2016 - Newsletter n.14: Visit ASTER at IPC APEX EXPO 2016 Show in Las Vegas
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21-OCT-2015:
TestWay news 2015
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21-OCT-2015:
November 2015 - Newsletter n.12: Visit ASTER at the AUTOTESTCON 2015 Show in Maryland, USA
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10-NOV-2015 to 13-NOV-2015:
Productronica - Visit ASTER at Productronoca, Hall A1, Booth 232. Information & registration (Munich, Germany)
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03-NOV-2015 to 05-NOV-2015:
IEEE AUTOTESTCON - Visit ASTER at the IEEE AutoTestCon, Booth 431. Information & registration. Press release (National Harbor, USE)
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21-APR-2015 to 23-APR-2015:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth B-1J14 (Shanghai, China)
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24-FEB-2015 to 26-FEB-2015:
IPC APEX EXPO - ASTER Technologies are exhibiting at APEX Expo between February 24th - 26th, 2015, Booth 415. So why not visit the booth during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)
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11-NOV-2014 to 14-NOV-2014:
Electronica - ASTER Technologies are exhibiting at Electronica.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools. Read more …with our press release. (Munich, Germany)
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23-APR-2014 to 25-APR-2014:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth A1-1E85 (Shanghai, China)
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25-MAR-2014 to 27-MAR-2014:
IPC APEX EXPO - Booth 607 (Las vegas, USA)
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TestWay with your ATE

TestWay is designed to work with and provide benefit to a wide range of testers. TestWay is particularly valuable on boards that use a combination of boundary scan and in-circuit test techniques (bed of nails or flying probe).

Acculogic Agilent Technologies Teradyne
Takaya corporation GenRad Corelis
JTAG Technologies Göpel electronic Intellitech
Asset Intertech Temento systems

TestWay for Boundary-Scan testers

  • Start test development from schematic data.
  • Generate all test data including netlist, models and configuration files for the following test systems: ASSET, ACCULOGIC, CORELIS, GOEPEL, INTELLITECH, JTAG Technologies, TEMENTO.
  • View fault location connecting layout and schematic.
  • Checks availability of BSDL files.
  • Verifies BSDL files against IEEE 1149.1 standard.
  • Identifies boundary scan chains and checks that each chain meets 1149.1 standard.
  • Predicts fault coverage.
  • Identifies clusters and manages test point insertion to partition clusters.
  • Identifies the optimal location of parallel accesses (test points).
  • Flying probe test program optimization.

TestWay for In-Circuit testers

  • Start test development from schematic data.
  • Generate all test data including netlist, models and configuration files for Agilent HP3070, GenRad 228x, Teradyne Z1800, Teradyne SPECTRUM.
  • View fault location connecting layout and schematic.
  • Conduct testability review.
  • Estimate fault coverage and perform real coverage measurements.
  • Provide bed-of-nails optimization (Test point minimization involving Boundary-Scan, analog components and clusters).

TestWay for Flying-Probes testers

  • Coverage prediction and measurement.
  • Test program optimizer (Up to 70% of test time saved) for TAKAYA APT8000 and APT9000.




 
     
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