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ENOVA Paris - Stand P24 (Paris, France)
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04-MAY-2017 :
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du 14-FEB-2017 au 16-FEB-2017 :
APEX EXPO - ASTER Technologies are exhibiting at the APEX EXPO in San Diego between February 14th - 16th, 2017. So why not visit booth 3844 during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, Etats-Unis)
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du 08-NOV-2016 au 11-NOV-2016 :
ASTER announces the first system level PCB viewer integrated with National Instruments TestStand.
Rendez visite à ASTER a Electronica, Hall A1, stand 232.
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14-SEP-2016 & 15-SEP-2016 :
ENOVA Paris - Stand D91 (Paris, France)
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Autotestcon - ASTER Technologies are exhibiting at Autotestcon on booth 1004 (Anaheim, Etats-Unis)
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Nepcon CHINA - Design for Excellence (DfX) - Vist ASTER during NEPCON exibition on Booth 1N17 (Shanghai, Chine)
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du 15-MAR-2016 au 17-MAR-2016 :
IPC APEX EXPO - Pleasevisit us at booth 1651 (Las vegas, Etats-Unis)
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07-MAR-2016 :
March 2016 - Newsletter n.14: Visit ASTER at IPC APEX EXPO 2016 Show in Las Vegas
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21-OCT-2015 :
TestWay news 2015
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21-OCT-2015 :
November 2015 - Newsletter n.12: Visit ASTER at the AUTOTESTCON 2015 Show in Maryland, USA
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du 03-NOV-2015 au 05-NOV-2015 :
IEEE AUTOTESTCON - Rendez visite à ASTER sur le stand IEEE AutoTestCon, Stand 431. Information & inscription. Press release (National Harbor, Etats-Unis)
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du 22-SEP-2015 au 24-SEP-2015 :
ENOVA Paris - Hall 4, Stand E56. Badge gratuit (Paris, France)
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du 21-APR-2015 au 23-APR-2015 :
Nepcon CHINA - Design for Excellence (DfX) - Vist ASTER during NEPCON exibition on Booth B-1J14 (Shanghai, Chine)
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du 24-FEB-2015 au 26-FEB-2015 :
IPC APEX EXPO - ASTER Technologies are exhibiting at APEX Expo between February 24th - 26th, 2015, Booth 415. So why not visit the booth during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, Etats-Unis)
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du 11-NOV-2014 au 14-NOV-2014 :
Electronica - ASTER Technologies are exhibiting at Electronica.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools. Read more …with our press release. (Munich, Allemagne)
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QuadView: Next Generation Viewers

QuadView adds new dimension to PCB schematic & layout viewing


ASTER has introduced the QuadView next generation viewers to their product portfolio. QuadView is a powerful set of scalable board viewing modules that can be used either as a standalone viewer or fully integrated within customer's applications.

QuadView's unique digitization capability allows users to create schematic views directly from searchable PDF files, and the innovative ‘Netlist Navigator’ provides virtual schematic views reconstructed directly from a board netlist. Layout views can be created from industry standard formats such as, GENCAD, CAMCAD, FATF, ODB++, or directly from any native CAD layout data such as Cadence, Mentor, Zuken, etc. The fault ticket analyzer provides full interaction between component and net references in any type of paperless repair fault ticket, exported from test, repair or inspection systems.
QuadView
Download Now QuadView Brochure
QuadView Brochure 

QuadView Fault ticket analysis

Key Product benefits


QuadView Concept

Ease of Use

Powerful, scalable visualization environment, consisting of schematic, netlist, layout and fault ticket viewing modules that can be used either standalone or integrated within customer’s applications. No pre-processing of CAD data needed.

Automated schematic creation

Unique digitization capability that allows users to create a schematic view directly from a searchable PDF file. Interactive with layout and Netlist Navigator.

Netlist Navigator

Reconstruct “virtual schematics” directly from a netlist, to provide a visual netlist navigation capability that includes advanced nodal detail.

Layout from native CAD formats

Create layout view from standard CAD formats such as GENCAD, CAMCAD, FATF, ODB++, or direct from native CAD layout data.

Fault ticket hot-links

Anyone who can surf the WWW can learn to use QuadView. Navigate between component and net references that appear as highlighted hot-links within the paperless fault ticket.

Fully Interactive Cross-probing

Cross-probe between layout, schematic and netlist viewers, and other products within the ASTER portfolio such as TestWay and Quad.

Flexible color assignment

Visualize test coverage and component pin properties using the QuadView color assignment palette, to simplify analysis and fault class recognition.

Functional test editor

Declare functional test coverage on both component and pin level. Simplify functional test diagnosis with the “Sherlock” algorithm.

Short-circuit search assistant

Reduce the time to locate short-circuits by intelligently highlighting areas where solder bridges are most likely.

Legacy product support

Migration Kit provides full backwards compatibility with legacy products DebugPlus, RepairPlus and FaultView.

 

Tell me more

Additional information

 

Other products

  • TPQR, Test Program Quality Report
  • TestWay, Board testability analyzer
  • Quad, Quality advisor and manager
  • QuadFeederSafe, make your feeder settings secure
  • WildScan, Boundary-Scan test translation


 
     
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