A selection of our customers:
25-APR-2017 to 27-APR-2017:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N14 (Shanghai, China)
14-FEB-2017 to 16-FEB-2017:
APEX EXPO - ASTER Technologies are exhibiting at the APEX EXPO in San Diego between February 14th - 16th, 2017. So why not visit booth 3844 during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)
08-NOV-2016 to 11-NOV-2016:
ASTER announces the first system level PCB viewer integrated with National Instruments TestStand.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools.
12-SEP-2016 to 15-SEP-2016:
Autotestcon - ASTER Technologies are exhibiting at Autotestcon on booth 1004 (Anaheim, USA)
26-APR-2016 to 28-APR-2016:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N17 (Shanghai, China)
15-MAR-2016 to 17-MAR-2016:
IPC APEX EXPO - Pleasevisit us at booth 1651 (Las vegas, USA)
March 2016 - Newsletter n.14: Visit ASTER at IPC APEX EXPO 2016 Show in Las Vegas
TestWay news 2015
November 2015 - Newsletter n.12: Visit ASTER at the AUTOTESTCON 2015 Show in Maryland, USA
10-NOV-2015 to 13-NOV-2015:
Productronica - Visit ASTER at Productronoca, Hall A1, Booth 232. Information & registration (Munich, Germany)
03-NOV-2015 to 05-NOV-2015:
IEEE AUTOTESTCON - Visit ASTER at the IEEE AutoTestCon, Booth 431. Information & registration. Press release (National Harbor, USE)
21-APR-2015 to 23-APR-2015:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth B-1J14 (Shanghai, China)
24-FEB-2015 to 26-FEB-2015:
IPC APEX EXPO - ASTER Technologies are exhibiting at APEX Expo between February 24th - 26th, 2015, Booth 415. So why not visit the booth during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)
11-NOV-2014 to 14-NOV-2014:
Electronica - ASTER Technologies are exhibiting at Electronica.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools. Read more …with our press release. (Munich, Germany)
23-APR-2014 to 25-APR-2014:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth A1-1E85 (Shanghai, China)
25-MAR-2014 to 27-MAR-2014:
IPC APEX EXPO - Booth 607 (Las vegas, USA)
QuadView: Next Generation Viewers
QuadView adds new dimension to PCB schematic & layout viewing
|ASTER has introduced the QuadView next generation viewers to their product
portfolio. QuadView is a powerful set of scalable board viewing modules that can be used
either as a standalone viewer or fully integrated within customer's applications.
QuadView's unique digitization capability allows users to create schematic views directly
from searchable PDF files, and the innovative ‘Netlist Navigator’ provides virtual schematic
views reconstructed directly from a board netlist. Layout views can be created from industry
standard formats such as, GENCAD, CAMCAD, FATF, ODB++, or directly from any native CAD layout
data such as Cadence, Mentor, Zuken, etc. The fault ticket analyzer provides full interaction
between component and net references in any type of paperless repair fault ticket, exported
from test, repair or inspection systems.
Key Product benefits
Ease of Use
Powerful, scalable visualization environment, consisting of schematic, netlist,
layout and fault ticket viewing modules that can be used either standalone or
integrated within customer’s applications. No pre-processing of CAD data needed.
Automated schematic creation
Unique digitization capability that allows users to create a schematic view
directly from a searchable PDF file. Interactive with layout and Netlist Navigator.
Reconstruct “virtual schematics” directly from a netlist, to provide a visual
netlist navigation capability that includes advanced nodal detail.
Layout from native CAD formats
Create layout view from standard CAD formats such as GENCAD, CAMCAD, FATF,
ODB++, or direct from native CAD layout data.
Fault ticket hot-links
Anyone who can surf the WWW can learn to use QuadView. Navigate between component and net references that appear as highlighted
hot-links within the paperless fault ticket.
Fully Interactive Cross-probing
Cross-probe between layout, schematic and netlist viewers, and other products
within the ASTER portfolio such as TestWay and Quad.
Flexible color assignment
Visualize test coverage and component pin properties using the QuadView color
assignment palette, to simplify analysis and fault class recognition.
Functional test editor
Declare functional test coverage on both component and pin level. Simplify
functional test diagnosis with the “Sherlock” algorithm.
Short-circuit search assistant
Reduce the time to locate short-circuits by intelligently highlighting areas
where solder bridges are most likely.
Legacy product support
Migration Kit provides full backwards compatibility with legacy products
Tell me more
- TPQR, Test Program Quality Report
- TestWay, Board testability analyzer
- Quad, Quality advisor and manager
- QuadFeederSafe, make your feeder settings secure
- WildScan, Boundary-Scan test translation