A selection of our customers:

ASTER's satisfied customers

Latest news:

25-APR-2017 to 27-APR-2017:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N14 (Shanghai, China)

14-FEB-2017 to 16-FEB-2017:
APEX EXPO - ASTER Technologies are exhibiting at the APEX EXPO in San Diego between February 14th - 16th, 2017. So why not visit booth 3844 during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)

08-NOV-2016 to 11-NOV-2016:
ASTER announces the first system level PCB viewer integrated with National Instruments TestStand.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools.

12-SEP-2016 to 15-SEP-2016:
Autotestcon - ASTER Technologies are exhibiting at Autotestcon on booth 1004 (Anaheim, USA)

26-APR-2016 to 28-APR-2016:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth 1N17 (Shanghai, China)

15-MAR-2016 to 17-MAR-2016:
IPC APEX EXPO - Pleasevisit us at booth 1651 (Las vegas, USA)

March 2016 - Newsletter n.14: Visit ASTER at IPC APEX EXPO 2016 Show in Las Vegas
TestWay news 2015
November 2015 - Newsletter n.12: Visit ASTER at the AUTOTESTCON 2015 Show in Maryland, USA
10-NOV-2015 to 13-NOV-2015:
Productronica - Visit ASTER at Productronoca, Hall A1, Booth 232. Information & registration (Munich, Germany)

03-NOV-2015 to 05-NOV-2015:
IEEE AUTOTESTCON - Visit ASTER at the IEEE AutoTestCon, Booth 431. Information & registration. Press release (National Harbor, USE)

21-APR-2015 to 23-APR-2015:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth B-1J14 (Shanghai, China)

24-FEB-2015 to 26-FEB-2015:
IPC APEX EXPO - ASTER Technologies are exhibiting at APEX Expo between February 24th - 26th, 2015, Booth 415. So why not visit the booth during the show, when we can discuss your requirements and demonstrate the many features of our analysis tools. (San Diego, USA)

11-NOV-2014 to 14-NOV-2014:
Electronica - ASTER Technologies are exhibiting at Electronica.
So why not visit the booth A1 352 when we can discuss your requirements and demonstrate our DfX & test coverage analysis tools. Read more …with our press release. (Munich, Germany)

23-APR-2014 to 25-APR-2014:
Nepcon CHINA - Vist ASTER during NEPCON exibition on Booth A1-1E85 (Shanghai, China)

25-MAR-2014 to 27-MAR-2014:
IPC APEX EXPO - Booth 607 (Las vegas, USA)

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Welcome to ASTER Technologies

Company Profile

ASTER Technologies is the leading supplier in Board-Level Testability analysis tools, which capitalizes on proven expertise in board testability and strong customer relations. Founded in 1993, ASTER develops a wide range of products dealing with PCB Testability, Viewing and Quality Management.

Our skilled employees constantly develop and enhance a suite of complementary products while our global network of specialists support our installed base worldwide, including independent support centers, distributors and value added resellers.
ASTER Headquarters
We take pride in possessing an in-depth understanding of customers' requirements and the expertise to create innovative solutions in electronics and software engineering. Our philosophy can be summarized in one sentence: "If there is no solution, it is because there is no problem."

Main Products

ASTER Technologies portfolio of electrical Testability Analysis, Board Viewing and Quality Management products have been developed over many years by working closely with our customers in fully understanding their problems and providing innovative solutions, to improve product yield from design through to production.

Improving yield management requires a deep insight into all quality aspects of electronics production. This is achieved through comprehensive electrical DfT analysis early in the design cycle, leading to efficient test distribution and fault coverage verification, whilst incorporating pro-active defect prevention; resulting in higher product reliability, ensuring that faulty products are not delivered to the customer, resulting in increased competitiveness and profitability.

TestWay TestWay is a proven solution, used by many PCB design and manufacturers worldwide that provides a unique approach to analyze electrical testability requirements and  estimate test coverage aligned to specific test strategies, at the earliest opportunity in the design cycle. The TestWay open architecture design is based on a testability framework that interfaces with a variety of plug-in modules to provide both import and export opportunities that make it fully customizable to customer's specific requirements.
QuadView QuadView is a powerful set of scalable board viewing modules that can be used either as a standalone viewer or fully integrated within customer's applications. QuadView can be used in the design environment to assist in DfT and test coverage analysis. Whereas, within the manufacturing environment it becomes an integral part of the repair cycle, assisting in locating faults and reducing repair time significantly.
Quad QUAD is a flexible modular Quality Management tool built around a centralized and open architecture database, providing traceability for any PCB electronic production data. QUAD covers all quality aspects of PCB assembly, sub-assembly and system build, allowing you to manage the quality data flow from product realization to product retirement. It has been designed to be used either standalone or to be easily integrated into any existing production environment.
WildScan WildScan is a product that makes it possible to migrate a Boundary-Scan test (BST) program to an In-Circuit tester (ICT) without the need for any complementary hardware integration within the In-Circuit tester. This significantly reduces test fixturing costs by utilising the same test fixture for both Boundary-Scan and In-Circuit testing, providing a one-stop test solution.

Recent activity

Upcoming events
  • Productronica, 13-NOV-2007 to 16-NOV-2007 - Hall A1 - Stand 452 (Munich, Germany)
  • Nepcon UK, 5-MAY-2007 to 17-MAY-2007 - Stand G46 (Birmingham NEC, United Kingdom)
  • Boundary Scan Day, 28-FEB-2007 (Cambridge University, United Kingdom)
  • Test In Production Event, 8-FEB-2007 (Eindhoven, The Netherlands)
  • Electronica, 14-NOV-2006 to 17-NOV-2006 - Stand A1-548 (Munich, Germany)
  • Forum of Electronics, 16-OCT-2006 to 18-OCT-2006 - Stand J80 (Paris, France)
  • French ASTER User's Group, 4 & 5-OCT-2006 (Rennes, France)
  • ASTER renews the partnership with Mentor Graphics OpenDoor.

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Aster - Solutions Provider for PCB Test, improving your yields from design to production.